DocumentCode :
1737427
Title :
Edge detection and automatic threshold based on wavelet transform in the VPPAW keyhole image processing
Author :
Liu, Zhonghua ; Wang, Qilong
Author_Institution :
Dept. of Welding, Harbin Inst. of Technol., China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
1048
Abstract :
In order to realize the feedback control for variable polarity plasma arc welding (VPPAW) formation in the weld process, the geometrical sizes of the keyhole image must be extracted. With the properties of multiscale edge through the wavelet theory, the edge points were detected by getting the maximum modulus of the gradient vector in the direction towards which the gradient vector points in the image plane. At coarse scales, the local maxima of modules have different positions and only detected the sharp edge. At fine scale, there are many maxima created by the image noise. One must integrate this multiscale information to look for the best scale where the edges are well discriminated from noises. A new method of peak analysis for threshold selection is provided. It is based on the wavelet transform which provides a multiscale analysis of the information of the histogram. Many experiments show these ways are effective for the keyhole image to get the geometry parameters of the keyhole in the real-time image processing
Keywords :
arc welding; control system synthesis; curve fitting; edge detection; feedback; process control; wavelet transforms; VPPAW keyhole image processing; automatic threshold; coarse scales; edge detection; feedback control; peak analysis; real-time image processing; threshold selection; variable polarity plasma arc welding; wavelet theory; wavelet transform; weld process; Feedback control; Image edge detection; Image processing; Image resolution; Object detection; Plasma materials processing; Plasma properties; Plasma welding; Signal detection; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location :
Rome
ISSN :
0197-2618
Print_ISBN :
0-7803-6401-5
Type :
conf
DOI :
10.1109/IAS.2000.881961
Filename :
881961
Link To Document :
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