DocumentCode :
1737749
Title :
Trinocular data registration using a three-dimensional self-organizing feature map
Author :
Knopf, George K. ; Sangole, Archana
Author_Institution :
Dept. of Mech. & Mater. Eng., Univ. of Western Ontario, London, Ont., Canada
Volume :
4
fYear :
2000
fDate :
2000
Firstpage :
2863
Abstract :
A three-dimensional self-organizing feature map (SOFM) that associates redundant and complementary features extracted from images acquired by a trinocular camera system is described. The combined features extracted from three views of the reference parts are used to train the SOFM. The unsupervised learning algorithm ensures that “similar” feature vectors will be assigned to cluster units that lie in close spatial proximity in the 3D feature map. The technique reduces the dimensionality of the input by exploiting hidden redundancies in the training data. During the identification phase, features in the novel test part activate a number of cluster units that have weights similar to the applied training input. If the sum-of-square error (SSE) between the input and weights of the cluster unit with the strongest response is greater than a predefined tolerance, then the test object is labeled as faulty part
Keywords :
cameras; feature extraction; image registration; self-organising feature maps; unsupervised learning; 3D feature map; SOFM; applied training input; close spatial proximity; cluster units; complementary features; faulty part; feature extraction; hidden redundancies; identification phase; novel test part; predefined tolerance; reference parts; similar feature vectors; sum-of-square error; test object; three-dimensional self-organizing feature map; training data; trinocular camera system; trinocular data registration; unsupervised learning algorithm; Cameras; Clustering algorithms; Data mining; Feature extraction; Inspection; Neural networks; Redundancy; Testing; Training data; Unsupervised learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 2000 IEEE International Conference on
Conference_Location :
Nashville, TN
ISSN :
1062-922X
Print_ISBN :
0-7803-6583-6
Type :
conf
DOI :
10.1109/ICSMC.2000.884432
Filename :
884432
Link To Document :
بازگشت