• DocumentCode
    1738010
  • Title

    Influence of swarming pulsive micro discharge on the tree degradation

  • Author

    Kawakubo, N. ; Ehara, Y. ; Kishida, H. ; Ito, T.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Musashi Inst. of Technol., Tokyo, Japan
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    325
  • Abstract
    An experimental investigation has been performed to analyze influence of swarming pulsive micro discharge (SPMD) on tree degradation process. The discharge magnitude and luminous image at several phase angle areas of applied voltage were measured using an original measurement system. The luminous image was digitized to the luminous quantity with a computer after experiment. Phase characteristic of the discharge magnitude and luminous quantity in the case of the void discharge passed through SPMD and did not pass through SPMD separately. The result shows deference of luminous quantity at the early stage of tree growth. The tree growth rate was measured and the quantitative evaluation of fractal dimension of the complexity of the tree channels was determined. Consequently, the tree growth rates of the sample passed through SPMD were slower than those of non SPMD and the densities of tree channels of the sample passed through SPMD was higher
  • Keywords
    electric strength; fractals; organic insulating materials; partial discharges; trees (electrical); voids (solid); discharge magnitude; fractal dimension; growth rate; luminous image; luminous quantity; phase angle areas; phase characteristic; swarming pulsive micro discharge; tree degradation; void discharge; Area measurement; Degradation; Electrodes; Needles; Phase measurement; Pulse amplifiers; Pulse measurements; Testing; Trees - insulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
  • Conference_Location
    Victoria, BC
  • Print_ISBN
    0-7803-6413-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.2000.885292
  • Filename
    885292