• DocumentCode
    1738142
  • Title

    On line conformity analysis on perforated plastic films by automated visual inspection

  • Author

    Duvieubourg, L. ; Caron, J. ; Postaire, J.-G.

  • Author_Institution
    Lab. d´´Autom., Univ. des Sci. et Tech. de Lille Flandres Artois, Villeneuve d´´Ascq, France
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    377
  • Abstract
    The Guial company produces the top veil of sanitary towels for women or baby napkins. The raw material is a plastic film that passes through a process to make holes. The success of the company is closely linked to the high and permanent quality control of its products. The amount of holes on the film (i.e. the percentage of open area) is the principal criterion that guarantees the quality of the final product. The film must be perforated so that the open area stands between 25% and 30% for a good absorption. The requirements from our industrial partner was to develop a low cost automatic system to inspect the perforated film on the production lines i.e. based on a personal computer architecture. The challenge was to implement algorithms on a PC based system, with high efficiency computational time and of course a good robustness versus different kinds of perturbations. From the images acquired by a CCD line scan camera, we compute the percentage of open area by the estimation of the cyclic ratio
  • Keywords
    automatic optical inspection; computer vision; production engineering computing; quality control; CCD line scan camera; Guial company; automated visual inspection; computational time; low cost automatic system; online conformity analysis; perforated plastic films; personal computer architecture; production lines; quality control; Absorption; Computer architecture; Computer industry; Costs; Microcomputers; Pediatrics; Plastic films; Production systems; Quality control; Raw materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Knowledge-Based Intelligent Engineering Systems and Allied Technologies, 2000. Proceedings. Fourth International Conference on
  • Conference_Location
    Brighton
  • Print_ISBN
    0-7803-6400-7
  • Type

    conf

  • DOI
    10.1109/KES.2000.885835
  • Filename
    885835