Accumulator-based self-adjusting output data compression for embedded word-organized DRAMs

An approach for periodic online testing of embedded DRAMs is presented. The fault-free memory contents are compressed, using accumulator-based response compaction, and periodically compared to subsequently compressed test data. The compressed signature is updated concurrently with write operations, without need for recomputing. Comparisons with previously proposed schemes indicate that the proposed scheme results in considerable savings in hardware overhead.