DocumentCode :
1738271
Title :
A novel eigenvector approach to pose and correspondence estimation
Author :
Xue, Zhong ; Teoh, Eam Khwang
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
1489
Abstract :
The paper proposes a novel eigenvector approach for pose and correspondence estimation between the feature points of two images or two point patterns under affine transformation. In the method, the proximity matrices, which record the normalized area features extracted from the two point sets are utilized to calculate the modes of each point set and the corresponding feature vectors. Then the point correspondence can be obtained by calculating the correlation of the feature vectors. To reduce the computation time, the idea of the principal component analysis (PCA) is adopted, which considers only the principal eigenvectors corresponding to the larger eigenvalues of each proximity matrix. As compared with the traditional eigenvector algorithm proposed by L.S. Shapiro and J.M. Brady (1992), the proposed algorithm is demonstrated to be more effective in estimating the point correspondence and the relevant parameters of affine transformation
Keywords :
eigenvalues and eigenfunctions; feature extraction; image matching; principal component analysis; vectors; affine transformation; computation time; correspondence estimation; eigenvalues; eigenvector algorithm; eigenvector approach; feature extraction; feature vectors; image feature points; normalized area features; point correspondence; point patterns; point sets; pose estimation; principal component analysis; principal eigenvectors; proximity matrices; proximity matrix; Algorithm design and analysis; Clustering algorithms; Eigenvalues and eigenfunctions; Feature extraction; Focusing; Least squares approximation; Parameter estimation; Principal component analysis; Research and development; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 2000 IEEE International Conference on
Conference_Location :
Nashville, TN
ISSN :
1062-922X
Print_ISBN :
0-7803-6583-6
Type :
conf
DOI :
10.1109/ICSMC.2000.886065
Filename :
886065
Link To Document :
بازگشت