DocumentCode
1738709
Title
Design of a fault tolerant multistage interconnection network with parallel duplicated switches
Author
Kamiura, Naotake ; Kodera, Takashi ; Matsui, Nobuyuki
Author_Institution
Dept. of Comput. Eng., Himeji Inst. of Technol., Hyogo, Japan
fYear
2000
fDate
2000
Firstpage
143
Lastpage
151
Abstract
In this paper we propose a fault tolerant baseline network as a sort of MINs (multistage interconnection networks) and discuss its performance analysis. For our MIN with N input and N output terminals, switching elements in the first and n-th stages are duplicated where n=log2N. Four-input two-output switching elements and two-input four output ones employed in the second and (n-1)-th stages are useful in sharing loads efficiently on the first and n-th stages respectively. The comparison results show that the theoretical throughput of our MIN without faults and the performance of our MIN with faults are superior to those of previously known ELMIN though our MIN requires slightly more hardware overhead than ELMIN
Keywords
fault tolerant computing; multistage interconnection networks; performance evaluation; ELMIN; MIN; fault tolerant multistage interconnection network; four-input two-output switching elements; hardware overhead; multistage interconnection networks; parallel duplicated switches; performance analysis; switching elements; Computer networks; Concurrent computing; Design engineering; Fault tolerance; Hardware; Multiprocessor interconnection networks; Parallel processing; Performance analysis; Switches; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
Conference_Location
Yamanashi
ISSN
1550-5774
Print_ISBN
0-7695-0719-0
Type
conf
DOI
10.1109/DFTVS.2000.887152
Filename
887152
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