Title :
A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions
Author :
Degraeve, R. ; Roussel, Ph ; Ogier, J.L. ; Groeseneken, G. ; Maes, H.E.
Author_Institution :
IMEC
Keywords :
Acceleration; Capacitors; Dielectric breakdown; Electric breakdown; Failure analysis; Integrated circuit reliability; MOS integrated circuits; Maximum likelihood estimation; Probability density function; Weibull distribution;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888183
