Title :
Influence of parasitic structures on the ESD performance of a pure bipolar process
Author :
Nikolaidïs, T. ; Richier, C. ; Reffay, M. ; Mortini, P. ; Pananakakis, G.
Author_Institution :
SGS-Thomson Microelectronics
Keywords :
BiCMOS integrated circuits; Biological system modeling; Bipolar integrated circuits; Circuit testing; Electrostatic discharge; Integrated circuit testing; Protection; Resistors; Semiconductor diodes; Stress;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888201
