Title :
Building-in reliability technology for diodes manufacturing
Author :
Bazu, M. ; Udrea-Spenea, M. ; Tsoi, E. ; Turtudau, F. ; Ilian, V. ; Papaioannou, G. ; Galateanu, L. ; Stan, A. ; Tserepi, A. ; Bucur, M.
Author_Institution :
IMT Bucharest, Romania
Abstract :
A building-in reliability technology was implemented to the manufacturing of Schottky power diodes. The main input variables (process and control parameters) contributing to the reliability were identified, optimised and monitored in the purpose to increase the reliability level
Keywords :
Schottky diodes; power semiconductor diodes; semiconductor device reliability; Schottky power diode; built-in reliability technology; device manufacturing; Birds; Condition monitoring; Input variables; Manufacturing; Materials testing; Power system reliability; Process control; Schottky diodes; Semiconductor device testing; Semiconductor diodes;
Conference_Titel :
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-5885-6
DOI :
10.1109/SMICND.2000.890248
