DocumentCode :
1739221
Title :
A characterization technique of high power/temperature devices using HP4275/3437 systems
Author :
Mitu, Florin ; Draghici, Florin ; Dilimot, Gheroghe ; Amitroaie, Cristian ; Vladan, Ionel ; Enache, Ioan
Author_Institution :
Univ. Politehnica Bucharest, Romania
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
345
Abstract :
This paper presents ways for increasing the number of measurement techniques of a ready made system. Using this technique we develop a platform for electrical and thermal characterization of the high power/high temperature devices
Keywords :
high-temperature electronics; power semiconductor devices; semiconductor device measurement; HP3437 system; HP4275 system; electrical characteristics; high power device; high temperature device; measurement technique; thermal characteristics; Breakdown voltage; Circuits; Current measurement; Diodes; Fluid flow measurement; Instruments; Measurement techniques; Silicon carbide; Temperature; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-5885-6
Type :
conf
DOI :
10.1109/SMICND.2000.890251
Filename :
890251
Link To Document :
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