• DocumentCode
    1739266
  • Title

    Correlation between the failure mechanism and dark currents of high power photodetectors

  • Author

    Islam, M.S. ; Nespola, A. ; Yeahia, M. ; Wu, M.C. ; Sivco, D.L. ; Cho, A.Y.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    82
  • Abstract
    We experimentally investigate the role of dark current on the failure mechanism of high power photodiodes. A theoretical model built to fit the experimental data indicates that the effective barrier height and the dark current are the fundamental parameters in the failure mechanism
  • Keywords
    dark conductivity; photodetectors; photodiodes; reliability; dark currents; effective barrier height; failure mechanism; fundamental parameters; high power photodetectors; theoretical model; Dark current; Failure analysis; P-i-n diodes; Photoconductivity; Photodetectors; Photodiodes; Power dissipation; Schottky diodes; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
  • Conference_Location
    Rio Grande
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-5947-X
  • Type

    conf

  • DOI
    10.1109/LEOS.2000.890684
  • Filename
    890684
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1739266