• DocumentCode
    1739372
  • Title

    Recent advances in polymer integrated-optics technology

  • Author

    Bechtel, James H. ; Yacoubian, Araz

  • Author_Institution
    IPITEK, Carlsbas, CA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    320
  • Abstract
    Traditional EO polymer modulators employ a Mach-Zehnder interferometer architecture with only one arm modulated under a microstrip line electrode. The Vπ of such modulator can be expressed as, Vπ=λh/n3r33LΓ (Eq. 1) where λ is the optical wavelength, h is the gap between electrodes, n is the index of refraction, r33 is the EO coefficient of the polymer waveguide layer, L is the interaction length, and Γ is a modal overlap integral. Low Vπ can be achieved by adjusting one or several parameters in Eq. 1. However, many factors such as reducing the gap distance or increasing the interaction length are limited by optical insertion loss and modulation frequency requirements. The most effective approach for low V, is to increase the EO coefficient r33, and recent work at the University of Southern California has demonstrated some limits to increasing the doping density of the nonlinear chromophores
  • Keywords
    Mach-Zehnder interferometers; electro-optical modulation; integrated optics; nonlinear optics; optical polymers; EO coefficient; EO polymer modulators; Mach-Zehnder interferometer architecture; doping density; gap distance; index of refraction; interaction length; microstrip line electrode; modal overlap integral; modulation frequency requirements; nonlinear chromophores; optical insertion loss; polymer integrated-optics technology; polymer waveguide layer; Electrodes; Electrooptic modulators; Electrooptical waveguides; Microstrip; Nonlinear optics; Optical interferometry; Optical modulation; Optical polymers; Optical refraction; Optical waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
  • Conference_Location
    Rio Grande
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-5947-X
  • Type

    conf

  • DOI
    10.1109/LEOS.2000.890807
  • Filename
    890807