DocumentCode
1739875
Title
A methodology for fault model development for hierarchical linear systems
Author
Huang, Yin-Chao ; Lee, Chung-Len ; Lin, Jun-Weir ; Chen, Jwu-E ; Su, Chau-Chin
Author_Institution
Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
2000
fDate
2000
Firstpage
90
Lastpage
95
Abstract
In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers (OP) is demonstrated and presented. The methodology at first presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. An application of the derived models to Monte Carlo simulation to save computation time is also demonstrated
Keywords
Monte Carlo methods; analogue circuits; closed loop systems; fault diagnosis; fault simulation; modules; operational amplifiers; transfer functions; AC fault model; Monte Carlo simulation; benchmark state-variable filter; closed loop; computation time; element faults; fault model; hierarchical linear systems; open-loop; operational amplifiers; state variable filter; transfer function model; Analog circuits; Automatic test pattern generation; Circuit faults; Circuit testing; Digital circuits; Filters; Linear systems; Operational amplifiers; Test pattern generators; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location
Taipei
ISSN
1081-7735
Print_ISBN
0-7695-0887-1
Type
conf
DOI
10.1109/ATS.2000.893608
Filename
893608
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