Title :
A methodology for fault model development for hierarchical linear systems
Author :
Huang, Yin-Chao ; Lee, Chung-Len ; Lin, Jun-Weir ; Chen, Jwu-E ; Su, Chau-Chin
Author_Institution :
Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers (OP) is demonstrated and presented. The methodology at first presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. An application of the derived models to Monte Carlo simulation to save computation time is also demonstrated
Keywords :
Monte Carlo methods; analogue circuits; closed loop systems; fault diagnosis; fault simulation; modules; operational amplifiers; transfer functions; AC fault model; Monte Carlo simulation; benchmark state-variable filter; closed loop; computation time; element faults; fault model; hierarchical linear systems; open-loop; operational amplifiers; state variable filter; transfer function model; Analog circuits; Automatic test pattern generation; Circuit faults; Circuit testing; Digital circuits; Filters; Linear systems; Operational amplifiers; Test pattern generators; Transfer functions;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893608