Title :
Near-field microscopy of photonic devices
Author :
Goldberg, Bennett B.
Author_Institution :
Dept. of Phys., Boston Univ., MA, USA
Abstract :
Near-field scanning optical microscopy has been used to measure internal optical modes in photonic devices. By combining the standing mode period, transverse mode shape and decay constants, the values of all spatial components of the wavevector are determined
Keywords :
integrated optics; near-field scanning optical microscopy; optical testing; optical waveguides; decay constants; guided wave optical device testing; internal optical modes; near-field microscopy; near-field scanning optical microscopy; photonic devices; spatial components; standing mode period; transverse mode shape; wavevector; Integrated optics; Large Hadron Collider; Optical coupling; Optical devices; Optical fiber networks; Optical microscopy; Optical scattering; Optical waveguides; Shape; Silicon compounds;
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
Print_ISBN :
0-7803-5947-X
DOI :
10.1109/LEOS.2000.893896
