DocumentCode
1739966
Title
Continuous-wave operation of InGaN/GaN violet laser diodes grown by low-pressure MOVPE
Author
Hasnain, G. ; Takeuchi, Tetsuya ; Schneider, R. ; Song, Soonsil ; Twist, Rose ; Blomqvist, M. ; Kocot, Chris ; Flory, Curt
Author_Institution
Agilent Technol., Palo Alto, CA, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
655
Abstract
Continuous-wave operation of etched-facet InGaN/GaN multi-quantum-well laser diodes grown by low pressure MOVPE on sapphire substrate is demonstrated on-wafer at 15°C. The threshold current density and voltage are 9.1 kA/cm2 and 7.6 V respectively
Keywords
III-V semiconductors; MOCVD; current density; gallium compounds; indium compounds; quantum well lasers; semiconductor growth; vapour phase epitaxial growth; wide band gap semiconductors; 15 C; 7.6 V; InGaN-GaN; V-I characteristics; continuous-wave operation; etched-facet MQW; low-pressure MOVPE; sapphire substrate; threshold current density; threshold voltage; violet laser diodes; Coatings; Current measurement; Diode lasers; Epitaxial growth; Epitaxial layers; Gallium nitride; Laser beam cutting; Mirrors; Optical pulses; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location
Rio Grande
ISSN
1092-8081
Print_ISBN
0-7803-5947-X
Type
conf
DOI
10.1109/LEOS.2000.894012
Filename
894012
Link To Document