DocumentCode
1739994
Title
BISTing data paths at behavioral level
Author
Berthelot, David ; Flottes, Marie-Lise ; Ronzeyre, B.
Author_Institution
LIRMM, Montpellier, France
fYear
2000
fDate
2000
Firstpage
672
Lastpage
680
Abstract
This paper presents a method for deriving a BIST specification directly from the initial specification of datapath architectures. It minimizes BIST area overhead while guaranteeing user chosen fault coverage. The results show great improvements over lower level techniques
Keywords
built-in self test; circuit CAD; circuit optimisation; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; logic testing; BIST area overhead minimisation; BIST specification; CAD; behavioral level; data path initial specification; datapath architectures; user chosen fault coverage; Arithmetic; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Costs; High level synthesis; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894262
Filename
894262
Link To Document