Title :
Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register
Author :
Bakalis, D. ; Nikolos, D. ; Kavousianos, X.
Abstract :
In this paper we show that an accumulator can be modified to behave as a Non-Linear Feedback Shift Register suitable for test response compaction. The hardware required for this modification is less than that required to modify a register to a Multiple Input Linear Feedback Shift Register, MISR. We show with experiments on ISCAS´85, ISCAS´89 benchmark circuits and various types of multipliers that the post-compaction fault coverage obtained by the proposed scheme is higher than that of the already known accumulator based compaction schemes and in most cases identical to that achieved using a MISR
Keywords :
built-in self test; circuit feedback; logic testing; multiplying circuits; shift registers; ISCAS´85 benchmark circuits; ISCAS´89 benchmark circuits; MISR; Multiple Input Linear Feedback Shift Register; fault coverage; multiple input; multipliers; nonlinear feedback shift register; test response compaction; Adders; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Feedback; Hardware; Informatics; Shift registers;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894277
