• DocumentCode
    1740380
  • Title

    Routine test interval decision for protective systems based on probabilistic approach

  • Author

    Kangvansaichol, K. ; Pittayapat, P. ; Eua-Arporn, B.

  • Author_Institution
    Dept. of Electr. Eng, Chulalongkorn Univ., Bangkok, Thailand
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    977
  • Abstract
    An appropriate routine test interval is necessary for each protective scheme to obtain the maximum availability in a protective system. The main purpose of this paper is to estimate the optimum routine test interval, and to determine the reliability indices for several configurations of overcurrent relay protection. In this paper, a Markov model is employed to represent each protective device, which is then combined to form a particular protective scheme. Each scheme together with its protected component are combined to form a complete system to be inspected. A mathematical model of an inspected system is defined to evaluate the abnormal unavailability and optimum test interval. The results obtained from the analysis shows that this method can distinguish the differences of several configurations of overcurrent relay scheme. In addition, abnormal unavailability and optimum test interval depend directly on several parameters, e.g. failure rate, repair rate, self-test effectiveness etc
  • Keywords
    Markov processes; overcurrent protection; power system protection; power system reliability; probability; relay protection; Markov model; abnormal unavailability; failure rate; inspected system; mathematical model; maximum availability; optimum routine test interval; optimum test interval; overcurrent relay protection; probabilistic approach; protective systems; reliability indices determination; repair rate; routine test interval decision; self-test effectiveness; Automatic testing; Availability; Built-in self-test; Circuit faults; Current transformers; Digital relays; Power system modeling; Power system protection; Protective relaying; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power System Technology, 2000. Proceedings. PowerCon 2000. International Conference on
  • Conference_Location
    Perth, WA
  • Print_ISBN
    0-7803-6338-8
  • Type

    conf

  • DOI
    10.1109/ICPST.2000.897153
  • Filename
    897153