Title : 
Trapping cortical rat neurons
         
        
            Author : 
Heida, T. ; Rutten, W.L.C. ; Marani, E.
         
        
            Author_Institution : 
Inst. for Biomed. Technol., Twente Univ., Enschede, Netherlands
         
        
        
        
        
        
            Abstract : 
Cortical rat neurons were trapped by dielectrophoresis (DEP). Experimental data were compared with theoretically deduced relationships. The neuron was represented by a single-shell model. A planar quadrupole electrode structure was used for the creation of a nonuniform field. The electrode structure was modeled as four point charges. The experimental data did almost completely fit the theoretical yield/time relationship. The theoretical yield/amplitude relationship, however, did only apply for a restricted amount of frequencies. The experimental frequency behaviour (i.e., the DEP-spectrum) did not apply to the theory. A difference in neuronal physiological state can produce different DEP-spectra. For two frequencies (10 kHz and 14 MHz) adhesion to the substrate and outgrowth of the neurons was investigated
         
        
            Keywords : 
adhesion; bioelectric phenomena; biological techniques; brain; electrophoresis; microelectrodes; neurophysiology; 10 kHz; 14 MHz; Clausius-Mosotti factor; adhesion to substrate; cortical rat neurons trapping; dielectrophoresis; four point charges; microelectrode plate; neuronal physiological state; nonuniform field; outgrowth of neurons; planar quadrupole electrode structure; single-shell model; yield/amplitude relationship; yield/time relationship; Adhesives; Dielectrophoresis; Electric fields; Electrodes; Frequency; Glass; Insulation; Neurons; Nonuniform electric fields; Position measurement;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
         
        
            Conference_Location : 
Chicago, IL
         
        
        
            Print_ISBN : 
0-7803-6465-1
         
        
        
            DOI : 
10.1109/IEMBS.2000.897974