DocumentCode :
1740973
Title :
Simulation output analysis via dynamic batch means
Author :
Yeh, Yingchieh ; Schmeiser, Bruce
Author_Institution :
Sch. of Ind. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
637
Abstract :
This paper is focused on estimating the quality of the sample mean from a steady-state simulation experiment with consideration of computational efficiency, memory requirement, and statistical efficiency. In addition, we seek methods that do not require knowing run length a priori. We develop an algorithm of nonoverlapping batch means that is implemented in fixed memory by dynamically changing both batch size and number of batches as the simulation runs. The algorithm, denoted by DBM for Dynamic Batch Means, requires computation time similar to other batch means data-collection methods, despite its fixed memory requirement. To achieve satisfactory statistical efficiency of DBM, we propose two associated estimators, VˆTBM and VˆPBM, of the variance of the sample mean and investigate their statistical properties. Our study shows that the estimator VˆPBM with parameter w=1 is, as a practical matter, better than the other proposed estimators
Keywords :
batch processing (industrial); digital simulation; stochastic processes; computation time; computational efficiency; dynamic batch means; memory requirement; nonoverlapping batch means; run length a priori; sample mean; simulation output analysis; statistical efficiency; steady-state simulation; Analytical models; Computational efficiency; Computational modeling; Industrial engineering; Measurement standards; Parameter estimation; Probability; Random access memory; Steady-state; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 2000. Proceedings. Winter
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-6579-8
Type :
conf
DOI :
10.1109/WSC.2000.899775
Filename :
899775
Link To Document :
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