• DocumentCode
    1741058
  • Title

    Validation of trace-driven simulation models: more on bootstrap tests

  • Author

    Kleijnen, Jack P C ; Cheng, Russell C H ; Bettonvil, Bert

  • Author_Institution
    Dept. of Inf. Syst., Tilburg Univ., Netherlands
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    882
  • Abstract
    Trace-driven or correlated inspection simulation means that the simulated and the real systems have some common inputs (say, arrival times) so the two systems´ outputs are cross-correlated. To validate such simulation models, this paper formulates six validation statistics, which are inspired by practice and statistical analysis; for example, the simplest statistic is the difference between the average simulated and real responses. To evaluate these validation statistics, the paper develops novel types of bootstrapping based on subruns. Three basic bootstrap procedures are devised, depending on the number of simulation replicates: one, two, or more replicates. Moreover, for the case of more than two replicates the paper considers conditional versus unconditional resampling. These six validation statistics and four bootstrap procedures are evaluated in extensive Monte Carlo experiments with single-server queueing systems. The main conclusion is that bootstrapping of the simplest validation statistic gives the correct type I error probability, and has relatively high power
  • Keywords
    Monte Carlo methods; error statistics; queueing theory; simulation; statistical analysis; Monte Carlo experiments; bootstrap tests; bootstrapping; conditional resampling; correlated inspection simulation; error probability; single-server queueing systems; statistical analysis; trace-driven simulation model validation; unconditional resampling; validation statistics; Analytical models; Error analysis; Error probability; Information systems; Lifting equipment; Monte Carlo methods; Power generation economics; Statistical analysis; Statistics; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2000. Proceedings. Winter
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-6579-8
  • Type

    conf

  • DOI
    10.1109/WSC.2000.899888
  • Filename
    899888