Title :
A functional database for guidance of surgical and therapeutic procedures in the deep brain
Author :
Finnis, Kirk W. ; Starreveld, Yves P. ; Parrent, Andrew G. ; Peters, Terry M.
Author_Institution :
Dept. of Med. Biophys., Univ. of Western Ontario, London, Ont., Canada
Abstract :
Current techniques for stereotactic neurosurgery of the deep brain require identification of targets by preoperative image localization. These structures are also surrounded by critical brain areas which must not be damaged by the surgical procedure. We have designed and implemented a searchable and expandable database of functional organization for the sensorimotor thalamus, internal capsule, and internal pallidum from a population of over 70 patients. Data were obtained through microcellular recording, microstimulation, and macrostimulation mapping performed during stereotaetic thalamotomies and pallidotomies. These data may be in turn registered to a patient 3D MRI within our image guided visualization platform. This functional database, provides a visual representation of functional organization in the deep brain, facilitating physiological exploration and preoperative planning
Keywords :
biomedical MRI; brain; data visualisation; image segmentation; medical image processing; neurophysiology; surgery; visual databases; 3D MRI; deep brain; functional database; functional organization; image guided visualization platform; internal capsule; internal pallidum; macrostimulation mapping; microcellular recording; microstimulation; nonlinear warping; physiological exploration; preoperative image localization; preoperative planning; probability database; searchable expandable database; sensorimotor thalamus; stereotactic neurosurgery; surgical procedure guidance; therapeutic procedure guidance; Brain; Data visualization; Image databases; Kirk field collapse effect; Lesions; Magnetic resonance; Magnetic resonance imaging; Neurosurgery; Surgery; Visual databases;
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-6465-1
DOI :
10.1109/IEMBS.2000.900430