Title :
Evaluation of the calculated PDD of a 3D electron beam algorithm in a radiotherapy planning system
Author :
Gracia, A. ; Linero, D. ; Picón, C. ; Saldana, O. ; Lizuain, M.C.
Author_Institution :
Inst. Catala d´´Oncologia, Barcelona, Spain
Abstract :
The authors evaluated calculations of Percent Depth Dose (PDD) when the grid size and position were changed in the Cadplan radiotherapy planning system. A Scanditronix diode and a plane parallel ionization chamber were used to obtain measured PDD. The measurements were performed on Clinac 2100 C with 6, 9, 12, 16 and 20 MeV electrons, for all electron applicators and representative clinical fields. Cadplan calculations for electrons are based on a generalized Gaussian pencil beam model. The PDD were extracted from the calculated dose distributions with a variable step (1-1.5 mm) between the points (100 points is the maximum) regardless of the grid size, using the Cadplan dose vertical line utility. The curves showed a good agreement, within ±2 mm or ±3% for all electrons beams. For small grid size (1.25-2.5 mm, used in general for low energy electrons), the PDD were discontinuous and not as smooth as the measured PDD. These discrepancies or discontinuities were in general within ±3% for the fields and energies measured. In conclusion, Cadplan calculations for PDD are in good agreement with measurements. When a small grid size is used, the calculated PDD are not as smooth as the measured PDD
Keywords :
dosimetry; electron beam applications; radiation therapy; 1.25 to 2.5 mm; 3D electron beam algorithm; 6 to 20 MeV; Cadplan dose vertical line utility; Cadplan radiotherapy planning system; Scanditronix diode; grid size; low energy electrons; percent depth dose calculations; plane parallel ionization chamber; small grid size; Applicators; Diodes; Electron beams; Energy measurement; Ionization chambers; Manufacturing; Performance evaluation; Shape; Size measurement; System testing;
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-6465-1
DOI :
10.1109/IEMBS.2000.900714