• DocumentCode
    1741430
  • Title

    Effects of refractoriness on the statistics of the post-membrane output IPIs

  • Author

    Hu, X.L. ; Zhang, Y.T.

  • Author_Institution
    Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    589
  • Abstract
    Refractory period is an important factor that affects output inter-pulse intervals (LPIs) statistics at post-membrane position of a gap function. However this factor is seldom considered in analyses of the synaptic pulse train transmission. Based on the previous theoretical study, a general form of the p.d.f. of post-membrane output IPIs is obtained in this work. The exponential and Gaussian distributed input IPIs to the gap junction are used for verification, and the results show that the theoretical results are consistent with the simulated ones for the two cases studied
  • Keywords
    Gaussian distribution; bioelectric potentials; biomembranes; neurophysiology; physiological models; statistics; Gaussian distributed input; gap function; neuronal membrane; neurophysiological modeling; output inter-pulse intervals; post-membrane; post-membrane output IPIs statistics; refractoriness effects; synaptic pulse train transmission analysis; Biological neural networks; Biological system modeling; Biomembranes; Electrodes; Probability; Random processes; Random variables; Signal processing; Statistical distributions; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-6465-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.2000.900812
  • Filename
    900812