Title :
A morphological estimator for clique potentials of binary Markov random fields
Author :
Sivakumar, K. ; Goutsias, John
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
Abstract :
The problem of parameter estimation for a binary Markov random field, from a given realization, is addressed. A strongly consistent estimator for the clique potentials, based on morphological erosions, is proposed. Experimental results demonstrate the effectiveness of the proposed approach
Keywords :
Markov processes; image processing; mathematical morphology; parameter estimation; random processes; binary Markov random field; clique potentials; consistent estimator; image analysis; image processing; morphological erosions; morphological estimator; parameter estimation; second-order binary Markov random fields; Grid computing; Hardware; Image analysis; Image texture analysis; Markov random fields; Maximum likelihood estimation; Monte Carlo methods; Parameter estimation; Random variables; Robustness;
Conference_Titel :
Image Processing, 2000. Proceedings. 2000 International Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-6297-7
DOI :
10.1109/ICIP.2000.900945
