DocumentCode :
1741610
Title :
Image classification using pseudo power signatures
Author :
Venkatachalam, Vidya
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
796
Abstract :
Segmentation and classification are important problems with applications in areas like textural analysis and pattern recognition. This paper describes a single-stage approach to solve the image segmentation/classification problem down to the pixel level, using energy density functions based on the wavelet transform. The energy density functions obtained, called pseudo power signatures, are essentially functions of the scale and orientation and are obtained using separable approximations to the 2-D wavelet transform. A significant advantage of these representations is that they are invariant to signal magnitude, and spatial location within the object of interest. Further, they lend themselves to fast and simple classification routines. We provide a complete formulation of the signature determination problem for 2-D, and propose an effective, albeit simple, technique based on a tensor singular value analysis, to solve the problem. We also present an efficient computational algorithm, and a simulation result reflecting the strengths and limitations of this approach
Keywords :
image classification; image representation; image segmentation; image texture; principal component analysis; singular value decomposition; wavelet transforms; 2D wavelet transform; 4D matrix SVD; efficient computational algorithm; energy density functions; image classification; image representation; image segmentation; pattern recognition; pixel level; pseudo power signatures; separable approximations; signal magnitude; signature determination problem; simulation result; singular value decomposition; singular value principal component analysis; spatial location; tensor singular value analysis; textural analysis; Computational modeling; Density functional theory; Image classification; Image segmentation; Image texture analysis; Pattern analysis; Pattern recognition; Pixel; Tensile stress; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2000. Proceedings. 2000 International Conference on
Conference_Location :
Vancouver, BC
ISSN :
1522-4880
Print_ISBN :
0-7803-6297-7
Type :
conf
DOI :
10.1109/ICIP.2000.901079
Filename :
901079
Link To Document :
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