Title :
A new portable electronic device for single exposure half-value layer measurement
Author :
Schiabel, Homero ; Vieira, Marcelo A C ; Curi, Newton S M
Author_Institution :
Dept. of Electr. Eng., Sao Paulo Univ., Brazil
Abstract :
A new device to be used for half-value layer (HVL) measurements in quality assurance procedures is presented. This device uses a silicon X-ray sensor coupled to an electronic circuit that is connected to a portable computer (notebook) for data storage and analysis. HVL measurements can be performed for a single X-ray exposure and real-time results are presented on the notebook screen
Keywords :
X-ray detection; biomedical electronics; computerised instrumentation; diagnostic radiography; dosimetry; medical diagnostic computing; silicon radiation detectors; Si; attenuation curve; dedicated software; diagnostic radiology; dosimetry; notebook screen; portable computer; portable electronic device; quality assurance procedures; real-time results; silicon X-ray sensor; single X-ray exposure; single exposure half-value layer measurement; Aluminum; Attenuation measurement; Data analysis; Filters; Mechanical sensors; Performance evaluation; Quality assurance; Radiology; Signal generators; Silicon;
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-6465-1
DOI :
10.1109/IEMBS.2000.901336
