Title :
Mapping the phase of light in an integrated optical waveguide device
Author :
Balistreri, M.L.M. ; Korterik, J.P. ; Kuipers, L. ; van Hulst, N.F.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
Abstract :
Summary form only given. Nowadays, a measurement of the intensity of the optical field in integrated optical waveguide devices with a photon scanning tunneling microscope (PSTM) is reasonably routine. However, if one could visualize the evolution of the phase of the light field in real-space, it would yield new and detailed information concerning the properties of wavelength multiplexers, mode converters, etc., of which the operation depends critically on the phase of the light. We believe we present the first phase maps of light in integrated optical waveguides obtained with a heterodyne interference PSTM.
Keywords :
Mach-Zehnder interferometers; integrated optics; light interferometry; optical microscopes; optical variables measurement; optical waveguide components; phase measurement; scanning tunnelling microscopy; critical dependence; heterodyne interference photon scanning tunneling microscope; integrated optical waveguide device; integrated optical waveguide devices; integrated optical waveguides; light phase mapping; mode converters; operation; optical field intensity; phase maps; photon scanning tunneling microscope; real-space; wavelength multiplexers; Integrated optics; Multiplexing; Optical devices; Optical microscopy; Optical mixing; Optical waveguides; Tunneling; Visualization; Wavelength converters; Wavelength measurement;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-608-7