Title :
Exciton dephasing in single InGaAs quantum dots
Author :
Leosson, Kristjan ; Erland, J. ; Jensen, Jesper Rindom ; Hvam, J.M.
Author_Institution :
Res. Centre COM, Tech. Univ. Denmark, Lyngby, Denmark
Abstract :
Summary form only given. The homogeneous linewidth of excitonic transitions is a parameter of fundamental physical importance. In self-assembled quantum dot systems, a strong inhomogeneous broadening due to dot size fluctuations masks the homogeneous linewidth associated with transitions between individual states. The homogeneous and inhomogeneous broadening of InGaAs quantum dot luminescence is of central importance for the potential application of this material system in optoelectronic devices. Recent measurements of MOCVD-grown InAs/InGaAs quantum dots indicate a large homogeneous broadening at room temperature due to fast dephasing. We present an investigation of the low-temperature homogeneous linewidth of individual PL lines from MBE-grown In/sub 0.5/Ga/sub 0.5/As/GaAs quantum dots.
Keywords :
III-V semiconductors; excitons; gallium arsenide; indium compounds; molecular beam epitaxial growth; photoluminescence; self-assembly; semiconductor heterojunctions; semiconductor quantum dots; spectral line broadening; 10 K; In/sub 0.5/Ga/sub 0.5/As-GaAs; In/sub 0.5/Ga/sub 0.5/As/GaAs quantum dots; InAs/InGaAs; InGaAs; InGaAs quantum dots; MBE-grown quantum dots; MOCVD-grown quantum dots; dot size fluctuations; exciton dephasing; excitonic transitions; fast dephasing; fundamental physical importance; homogeneous broadening; homogeneous linewidth; inhomogeneous broadening; low-temperature homogeneous linewidth; optoelectronic devices; photoluminescence lines; quantum dot luminescence; room temperature; self-assembled quantum dot systems; single quantum dots; transitions; Atomic force microscopy; Dielectrics; Electromagnetic waveguides; Excitons; Gallium arsenide; Optical reflection; Optical waveguides; Quantum dots; Scanning electron microscopy; US Department of Transportation;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-608-7