• DocumentCode
    1741783
  • Title

    Exciton dephasing in single InGaAs quantum dots

  • Author

    Leosson, Kristjan ; Erland, J. ; Jensen, Jesper Rindom ; Hvam, J.M.

  • Author_Institution
    Res. Centre COM, Tech. Univ. Denmark, Lyngby, Denmark
  • fYear
    2000
  • fDate
    12-12 May 2000
  • Firstpage
    56
  • Lastpage
    57
  • Abstract
    Summary form only given. The homogeneous linewidth of excitonic transitions is a parameter of fundamental physical importance. In self-assembled quantum dot systems, a strong inhomogeneous broadening due to dot size fluctuations masks the homogeneous linewidth associated with transitions between individual states. The homogeneous and inhomogeneous broadening of InGaAs quantum dot luminescence is of central importance for the potential application of this material system in optoelectronic devices. Recent measurements of MOCVD-grown InAs/InGaAs quantum dots indicate a large homogeneous broadening at room temperature due to fast dephasing. We present an investigation of the low-temperature homogeneous linewidth of individual PL lines from MBE-grown In/sub 0.5/Ga/sub 0.5/As/GaAs quantum dots.
  • Keywords
    III-V semiconductors; excitons; gallium arsenide; indium compounds; molecular beam epitaxial growth; photoluminescence; self-assembly; semiconductor heterojunctions; semiconductor quantum dots; spectral line broadening; 10 K; In/sub 0.5/Ga/sub 0.5/As-GaAs; In/sub 0.5/Ga/sub 0.5/As/GaAs quantum dots; InAs/InGaAs; InGaAs; InGaAs quantum dots; MBE-grown quantum dots; MOCVD-grown quantum dots; dot size fluctuations; exciton dephasing; excitonic transitions; fast dephasing; fundamental physical importance; homogeneous broadening; homogeneous linewidth; inhomogeneous broadening; low-temperature homogeneous linewidth; optoelectronic devices; photoluminescence lines; quantum dot luminescence; room temperature; self-assembled quantum dot systems; single quantum dots; transitions; Atomic force microscopy; Dielectrics; Electromagnetic waveguides; Excitons; Gallium arsenide; Optical reflection; Optical waveguides; Quantum dots; Scanning electron microscopy; US Department of Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    1094-5695
  • Print_ISBN
    1-55752-608-7
  • Type

    conf

  • Filename
    901610