DocumentCode
1741789
Title
Nanometric probe-sample interactions via optical near fields: derivation and characteristics
Author
Sangu ; Kobayashi, Kaoru ; Ohtsu, M.
Author_Institution
ERATO Localized Photon Project, Japan Sci. & Tech. Corp., Tokyo, Japan
fYear
2000
fDate
12-12 May 2000
Firstpage
60
Lastpage
61
Abstract
Summary form only given. Recent experimental studies have revealed distinct characteristics of optical near fields. Highly localized optical near fields could be applied to not only a high-resolution microscope beyond the diffraction limit of light but also fabrication of nanometric devices. From this point of view, a theory, which quantitatively deals with interactions between a nanometric probe tip and sample, is required to describe the optical near-field systems. We have proposed a microscopic formulation of the optical near-field systems, and found that elementary excitation modes of exciton-polaritons, or virtual photons, give a good explanation for general properties of optical near fields. In this report, we derive the effective interactions more rigorously and elucidate characteristics of a nanometric probe-sample system.
Keywords
excitons; near-field scanning optical microscopy; polaritons; quantum optics; effective interactions; eigenfrequency; elementary excitation modes; exciton-polaritons; microscopic formulation; nanometric probe-sample interactions; optical near fields; potential operator; signal intensity; virtual photons; Nanoscale devices; Optical device fabrication; Optical devices; Optical diffraction; Optical microscopy; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location
San Francisco, CA, USA
ISSN
1094-5695
Print_ISBN
1-55752-608-7
Type
conf
Filename
901619
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