• DocumentCode
    1741789
  • Title

    Nanometric probe-sample interactions via optical near fields: derivation and characteristics

  • Author

    Sangu ; Kobayashi, Kaoru ; Ohtsu, M.

  • Author_Institution
    ERATO Localized Photon Project, Japan Sci. & Tech. Corp., Tokyo, Japan
  • fYear
    2000
  • fDate
    12-12 May 2000
  • Firstpage
    60
  • Lastpage
    61
  • Abstract
    Summary form only given. Recent experimental studies have revealed distinct characteristics of optical near fields. Highly localized optical near fields could be applied to not only a high-resolution microscope beyond the diffraction limit of light but also fabrication of nanometric devices. From this point of view, a theory, which quantitatively deals with interactions between a nanometric probe tip and sample, is required to describe the optical near-field systems. We have proposed a microscopic formulation of the optical near-field systems, and found that elementary excitation modes of exciton-polaritons, or virtual photons, give a good explanation for general properties of optical near fields. In this report, we derive the effective interactions more rigorously and elucidate characteristics of a nanometric probe-sample system.
  • Keywords
    excitons; near-field scanning optical microscopy; polaritons; quantum optics; effective interactions; eigenfrequency; elementary excitation modes; exciton-polaritons; microscopic formulation; nanometric probe-sample interactions; optical near fields; potential operator; signal intensity; virtual photons; Nanoscale devices; Optical device fabrication; Optical devices; Optical diffraction; Optical microscopy; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    1094-5695
  • Print_ISBN
    1-55752-608-7
  • Type

    conf

  • Filename
    901619