DocumentCode :
1741789
Title :
Nanometric probe-sample interactions via optical near fields: derivation and characteristics
Author :
Sangu ; Kobayashi, Kaoru ; Ohtsu, M.
Author_Institution :
ERATO Localized Photon Project, Japan Sci. & Tech. Corp., Tokyo, Japan
fYear :
2000
fDate :
12-12 May 2000
Firstpage :
60
Lastpage :
61
Abstract :
Summary form only given. Recent experimental studies have revealed distinct characteristics of optical near fields. Highly localized optical near fields could be applied to not only a high-resolution microscope beyond the diffraction limit of light but also fabrication of nanometric devices. From this point of view, a theory, which quantitatively deals with interactions between a nanometric probe tip and sample, is required to describe the optical near-field systems. We have proposed a microscopic formulation of the optical near-field systems, and found that elementary excitation modes of exciton-polaritons, or virtual photons, give a good explanation for general properties of optical near fields. In this report, we derive the effective interactions more rigorously and elucidate characteristics of a nanometric probe-sample system.
Keywords :
excitons; near-field scanning optical microscopy; polaritons; quantum optics; effective interactions; eigenfrequency; elementary excitation modes; exciton-polaritons; microscopic formulation; nanometric probe-sample interactions; optical near fields; potential operator; signal intensity; virtual photons; Nanoscale devices; Optical device fabrication; Optical devices; Optical diffraction; Optical microscopy; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location :
San Francisco, CA, USA
ISSN :
1094-5695
Print_ISBN :
1-55752-608-7
Type :
conf
Filename :
901619
Link To Document :
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