DocumentCode :
1741831
Title :
Carrier relaxation dynamics and photoluminescence efficiency in semiconductor quantum dots
Author :
Mikhailovsky, A. ; Xu, Songcen ; McBranch, D. ; Klimov, V.
Author_Institution :
Chem. Sci. & Tech. Div., Los Alamos Nat. Lab., NM, USA
fYear :
2000
fDate :
12-12 May 2000
Firstpage :
86
Lastpage :
87
Abstract :
Summary form only given. Due to the discrete structure of energy levels and an enhanced surface-to-volume ratio, energy relaxation and recombination dynamics in colloidal quantum dots (QDs) are significantly different from those in bulk materials. Energy relaxation leads to a fast establishment of quasi-equilibrium populations of electron and hole quantized states (sub-ps time scale). Depopulation of these states occurs via a variety of radiative and nonradiative mechanisms. The competition between these mechanisms determines the efficiency of the QD phololuminescence (PL). The most important processes competing with radiative recombination are carrier trapping at defect states and Auger recombination. At low pump intensities (less than one excitation per dot on average), the role of Auger effects is negligible and nonradiative carrier losses are dominated by surface trapping. We study the effect of surface/interface states on carrier dynamics and PL efficiency for strongly confined CdSe QDs (radius R=1-4 nm) with a range of surface properties. Our data indicate that significant changes in the PL quantum yield observed in samples with different surface passivations are primarily due to changes in hole relaxation.
Keywords :
Auger effect; II-VI semiconductors; cadmium compounds; carrier relaxation time; electron traps; electron-hole recombination; hole traps; interface states; passivation; photoluminescence; semiconductor quantum dots; surface states; time resolved spectra; 1 to 4 nm; Auger effects; Auger recombination; CdSe; CdSe quantum dots; bulk materials; carrier dynamics; carrier relaxation dynamics; carrier trapping; colloidal quantum dots; defect states; discrete structure; electron quantized states; energy levels; energy relaxation; enhanced surface-to-volume ratio; hole quantized states; hole relaxation; interface states; nonradiative carrier losses; nonradiative mechanism; photoluminescence efficiency; photoluminescence quantum yield; quantum dot photoluminescence; quasi-equilibrium populations; radiative mechanisms; radiative recombination; recombination dynamics; semiconductor quantum dots; strongly confined quantum dots; sub-picosecond time scale; surface passivations; surface properties; surface states; surface trapping; Carrier confinement; Charge carrier processes; Electron traps; Energy states; Interface states; Photoluminescence; Quantum dots; Radiative recombination; Semiconductor materials; Spontaneous emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location :
San Francisco, CA, USA
ISSN :
1094-5695
Print_ISBN :
1-55752-608-7
Type :
conf
Filename :
901678
Link To Document :
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