DocumentCode
174196
Title
Fabrication and characterization of self-aligned ZnO and TiO2 nanostructured films
Author
Ahmmad, Bashir ; Hayasaka, Shogo ; Kanomata, Kensaku ; Kubota, Sho ; Hirose, Fumihoko
Author_Institution
Grad. Sch. of Sci. & Eng., Yamagata Univ., Yonezawa, Japan
fYear
2014
fDate
23-24 May 2014
Firstpage
1
Lastpage
5
Abstract
Self-aligned nanostructured thin films of ZnO and TiO2 have been prepared by MOCVD and anodization method, respectively. The as-prepared films were characterized by XRD, SEM and XPS analysis. The deposition temperature and time have drastic effects on the crystallinity and morphology of the nanostructured ZnO films. On the other hand, films of TiO2 nanotube array (TNA) are markedly affected by the composition of electrolyte used during anodization process. The as-prepared TNA films are amorphous in nature but high crystallined anatase phase could be obtained at low temperature using hydrothermal treatment.
Keywords
II-VI semiconductors; MOCVD; X-ray diffraction; X-ray photoelectron spectra; anodisation; crystal morphology; nanofabrication; scanning electron microscopy; semiconductor growth; semiconductor nanotubes; semiconductor thin films; titanium compounds; wide band gap semiconductors; zinc compounds; MOCVD; SEM analysis; TiO2; XPS analysis; XRD analysis; ZnO; amorphous films; anatase phase; anodization method; crystallinity; deposition temperature; electrolyte composition; hydrothermal treatment; morphology; nanotube array films; self-aligned nanostructured thin films; Artificial intelligence; Distance measurement; Films; Heating; Substrates; Zinc oxide; Titania nanotube array; Whisker; ZnO films; anodization; chemical vapor deposition; hydrothermal treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Informatics, Electronics & Vision (ICIEV), 2014 International Conference on
Conference_Location
Dhaka
Print_ISBN
978-1-4799-5179-6
Type
conf
DOI
10.1109/ICIEV.2014.6850847
Filename
6850847
Link To Document