• DocumentCode
    174196
  • Title

    Fabrication and characterization of self-aligned ZnO and TiO2 nanostructured films

  • Author

    Ahmmad, Bashir ; Hayasaka, Shogo ; Kanomata, Kensaku ; Kubota, Sho ; Hirose, Fumihoko

  • Author_Institution
    Grad. Sch. of Sci. & Eng., Yamagata Univ., Yonezawa, Japan
  • fYear
    2014
  • fDate
    23-24 May 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Self-aligned nanostructured thin films of ZnO and TiO2 have been prepared by MOCVD and anodization method, respectively. The as-prepared films were characterized by XRD, SEM and XPS analysis. The deposition temperature and time have drastic effects on the crystallinity and morphology of the nanostructured ZnO films. On the other hand, films of TiO2 nanotube array (TNA) are markedly affected by the composition of electrolyte used during anodization process. The as-prepared TNA films are amorphous in nature but high crystallined anatase phase could be obtained at low temperature using hydrothermal treatment.
  • Keywords
    II-VI semiconductors; MOCVD; X-ray diffraction; X-ray photoelectron spectra; anodisation; crystal morphology; nanofabrication; scanning electron microscopy; semiconductor growth; semiconductor nanotubes; semiconductor thin films; titanium compounds; wide band gap semiconductors; zinc compounds; MOCVD; SEM analysis; TiO2; XPS analysis; XRD analysis; ZnO; amorphous films; anatase phase; anodization method; crystallinity; deposition temperature; electrolyte composition; hydrothermal treatment; morphology; nanotube array films; self-aligned nanostructured thin films; Artificial intelligence; Distance measurement; Films; Heating; Substrates; Zinc oxide; Titania nanotube array; Whisker; ZnO films; anodization; chemical vapor deposition; hydrothermal treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Informatics, Electronics & Vision (ICIEV), 2014 International Conference on
  • Conference_Location
    Dhaka
  • Print_ISBN
    978-1-4799-5179-6
  • Type

    conf

  • DOI
    10.1109/ICIEV.2014.6850847
  • Filename
    6850847