Title :
An approach for determining Phong reflectance parameters from real objects
Author :
Aparicio, Javier Iglesia ; García-Bermejo, Jaime Gómez
Author_Institution :
ETSIT, Valladolid Univ., Spain
Abstract :
Modeling reflectance properties from real objects is useful for solving many practical problems ranging from industrial inspection to computer graphics. In particular building computer graphics models directly from real objects has received increased attention, because it is useful in many important fields such as CAD, entertainment (3D games, movies) and virtual museums. The paper describes an automatic way to recover actual reflectance parameters, from range and intensity (or color) data acquired from objects. The proposed approach is based on the Phong reflection model, since this model is usually preferred for computer graphics
Keywords :
computer graphics; light reflection; reflectivity; rendering (computer graphics); 3D games; CAD; Phong reflectance parameters; Phong reflection model; computer graphics models; entertainment; intensity data; movies; range data; real objects; virtual museums; Automatic control; Computer graphics; Computer industry; Electrical equipment industry; Industrial control; Inspection; Optical reflection; Reflectivity; Shape; Systems engineering and theory;
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
Print_ISBN :
0-7695-0750-6
DOI :
10.1109/ICPR.2000.903609