• DocumentCode
    1742465
  • Title

    Low cost flip chip bumping

  • Author

    Oppert, Thomas ; Teutsch, Thorsten ; Zakel, Elke

  • Author_Institution
    Packaging Technol. GmbH, Nauen, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    72
  • Lastpage
    78
  • Abstract
    Flip chip (FC) technology is a driving force for increased speed and performance along with higher I/O count, and has therefore a high level of importance for a variety of applications. A breakthrough, however, will be the use of flip chip due to cost reduction. To achieve this aim, it is essential to use low cost bumping techniques. However, to provide FC technologies for devices with high I/O count and high pin density applications like microcontrollers, RAMBUS devices, etc., it is necessary to redistribute the historically peripheral bond pads with ultra fine pad pitch into a wafer level CSP. This paper describes a low cost electroless Ni/Au under bump metallization (UBM), a wafer level redistribution process based on electroless copper circuitization and different methods of single and multiple solder ball placement
  • Keywords
    electroless deposition; fine-pitch technology; flip-chip devices; gold; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; microassembling; nickel; soldering; Cu; FC technologies; Ni-Au; RAMBUS devices; cost reduction; device I/O count; device performance; device speed; electroless Ni/Au UBM; electroless Ni/Au under bump metallization; electroless copper circuitization; flip chip; flip chip bumping; flip chip technology; microcontrollers; multiple solder ball placement; peripheral bond pad redistribution; pin density; single solder ball placement; ultra fine pad pitch; wafer level CSP; wafer level redistribution process; Artificial intelligence; Chemical processes; Circuit testing; Coatings; Costs; Flip chip; Gold; Manufacturing processes; Metallization; Nickel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-6654-9
  • Type

    conf

  • DOI
    10.1109/EMAP.2000.904135
  • Filename
    904135