DocumentCode :
1742473
Title :
The applicability of electrodeposited photoresist in producing ultra-fine lines using sputtered seeding layers
Author :
Jalonen, Paavo ; Tuominen, Aulis
Author_Institution :
Pori Sch. of Technol. & Econ., Tampere Univ. of Technol., Finland
fYear :
2000
fDate :
2000
Firstpage :
152
Lastpage :
155
Abstract :
Photolithographic techniques are universally employed in the manufacturing of multilayer printed circuit-boards. Photoresist is one of the most complex materials used in circuit-board fabrication. Negative acting dry film type photoresists are mainly utilized in patterning, although liquid photoresist may be a good alternative. A uniform coating of the photoresist is critical because of variation in the thickness of the photoactive layer when spraying, or using roller-coating or dip-coating. When the photoresist system is based on an electrodeposition method, both the uniformity and thickness of the resist can be controlled. In this work, we tested the capability of electrodeposited, positive-acting photoresist thin film circuits on a sputtered seeding layer such as chromium. Full additive copper was used to produce copper lines. Epoxy reinforced fiberglass was used as a core material. The properties related to the quality of the process were examined, along with limitations of the process compared to a conventional dry film method and to a spin coating method
Keywords :
copper; electrodeposition; fine-pitch technology; photoresists; printed circuit manufacture; sputtered coatings; thickness control; Cr; Cr sputtered seeding layer; Cu; PCB manufacturing; circuit-board fabrication; copper lines; dip-coating; dry film method; electrodeposited photoresist; electrodeposited positive-acting photoresist thin film circuits; electrodeposition method; epoxy reinforced fiberglass core material; full additive copper; liquid photoresist; multilayer printed circuit-boards; negative acting dry film type photoresists; patterning; photoactive layer; photolithographic techniques; photoresist; photoresist system; process limitations; process quality; resist thickness; resist uniformity; roller-coating; spin coating method; spraying; sputtered seeding layers; thickness variation; ultra-fine lines; uniform coating; Circuit testing; Control systems; Copper; Dip coating; Fabrication; Manufacturing; Nonhomogeneous media; Resists; Spraying; Thickness control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904145
Filename :
904145
Link To Document :
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