DocumentCode :
1742486
Title :
Study on influence of environment on adhesion performance of underfill for flip chip application
Author :
Luo, Shijian ; Wong, C.P.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2000
fDate :
2000
Firstpage :
243
Lastpage :
250
Abstract :
This paper systematically discusses environmental effects (temperature and humidity) on the adhesion performance of underfill materials. The adhesion strengths of underfill with passivation materials were measured by die shear tests for various conditions. The adhesion strength between underfill and passivation is not affected significantly after thermal cycling tests for 1000 cycles. Die shear tests at elevated temperatures showed that underfill adhesion strength decreases with increase in test temperature above room temperature. The decreased adhesion strength versus temperature is probably due to the decrease of underfill modulus with increase in temperature. The sharp decrease occurs at a temperature below the glass transition temperature of the underfill. Underfill adhesion strength with different passivation materials decreases after aging in a high temperature/humidity environment. The adhesion degradation after high temperature/humidity aging is dependent on the hydrophilicity of the passivation. Hydrophilic passivation, e.g. SiO2 and SiN, shows much more severe adhesion degradation than hydrophobic passivation such as benzocyclobutene and polyimide. It is shown that adhesion stability for hydrophilic passivation can be successfully improved by use of coupling agents such as silane that introduce stable chemical bonds at the interface. Moisture diffusion kinetics into the 2 mm×2 mm die shear sample were studied. Although the adhesion strength degradation is due to moisture diffusion into the underfill, the adhesion degradation rate of die shear samples during aging at 85°C/85% RH is slower than moisture diffusion
Keywords :
adhesion; ageing; diffusion; encapsulation; environmental degradation; flip-chip devices; glass transition; humidity; integrated circuit interconnections; integrated circuit packaging; integrated circuit testing; passivation; plastic packaging; surface chemistry; thermal stresses; 2 mm; 85 C; SiN; SiN passivation; SiO2; SiO2 passivation; adhesion degradation; adhesion degradation rate; adhesion performance; adhesion strength; adhesion strength degradation; aging; benzocyclobutene passivation; coupling agents; die shear tests; environmental effects; flip chip application; glass transition temperature; high temperature/humidity aging; high temperature/humidity environment; humidity effects; hydrophilic passivation; hydrophilicity; hydrophobic passivation; moisture diffusion; moisture diffusion kinetics; passivation materials; polyimide passivation; stable interface chemical bonds; temperature effects; test temperature; thermal cycling tests; underfill; underfill adhesion strength; underfill materials; underfill modulus; Adhesives; Aging; Degradation; Glass; Humidity; Materials testing; Moisture; Passivation; Temperature dependence; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904162
Filename :
904162
Link To Document :
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