DocumentCode :
1742491
Title :
Development of no-flow underfill for lead-free bumped flip-chip assemblies
Author :
Zhang, Zhuqing ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2000
fDate :
2000
Firstpage :
297
Lastpage :
303
Abstract :
The no-flow underfill process in flip-chip assembly is promising for a smaller, faster and more cost-efficient packaging technology. Currently available no-flow underfill materials are mainly designed for eutectic Sn-Pb solders. This paper presents a new no-flow underfill for lead-free solder bumped flip-chip assemblies. Many epoxy resin/HMPA/metal acetylacetonate material systems have been screened in terms of their curing kinetics. Some potential base formulations with curing peak temperatures higher than 200°C were selected for further study. The proper fluxing agents were developed and the effects of fluxing agents on the curing kinetics and cured material properties of the potential base formulations were studied by differential scanning calorimetry (DSC), thermo-mechanical analyzer (TMA), dynamic-mechanical analyzer (DMA), thermo-gravimetric analyzer (TGA), and rheometer. The results show that the addition of flux significantly reduced the curing temperature and limits the potential of many formulations for application in lead-free bumped flip chip assemblies. The fluxing capability of several no-flow formulations is evaluated using wetting testing of lead-free solder balls on a copper board. The feasibility of the developed no-flow underfill is demonstrated using a lead-free bumped flip-chip package, which shows 100% interconnection yield after solder reflow
Keywords :
differential scanning calorimetry; encapsulation; environmental factors; flip-chip devices; heat treatment; integrated circuit interconnections; integrated circuit packaging; integrated circuit yield; microassembling; reaction kinetics; reflow soldering; rheology; wetting; Cu; DMA; DSC; Pb; TGA; TMA; base formulations; copper board; cost-efficient packaging technology; cured material properties; curing kinetics; curing peak temperatures; curing temperature; differential scanning calorimetry; dynamic-mechanical analyzer; epoxy resin/HMPA/metal acetylacetonate material systems; eutectic Sn-Pb solders; flip-chip assembly; flux addition; fluxing agents; fluxing capability; interconnection yield; lead-free bumped flip-chip assemblies; lead-free bumped flip-chip package; lead-free solder balls; lead-free solder bumped flip-chip assemblies; no-flow formulations; no-flow underfill; no-flow underfill materials; no-flow underfill process; rheometer; solder reflow; thermo-gravimetric analyzer; thermo-mechanical analyzer; wetting testing; Assembly; Curing; Environmentally friendly manufacturing techniques; Epoxy resins; Inorganic materials; Kinetic theory; Lead; Material properties; Packaging; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904170
Filename :
904170
Link To Document :
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