DocumentCode
1742816
Title
An absolute depth range measurement of 3-D objects based on modulation Moire topography
Author
Lu, Cunwei ; Inokuchi, Seiji
Author_Institution
Fukuoka Inst. of Technol., Japan
Volume
1
fYear
2000
fDate
2000
Firstpage
754
Abstract
It is the foundation that the absolute fringe order is discerned in 3-D image measurement methods, such as spatial pattern projection technique and Moire topography. The reason is that the depth range of the object is computed from the correspondence relation between the fringe order of a reflective pattern and the depth of an object. Multiple images are need by the conventional method for discerning the fringes order. Moreover, it has a problem of phase unwrapping in the phase analysis method of a Moire pattern or other interfering pattern. So it is difficult to calculate the absolute phase or to discern the relation between the fringes, especially in cases of which the fringes are discontinuous or the objects are isolated, and so forth. The technique of using modulation projection with 3-D information is presented. A new fringes pattern whose fringe intensity or color changes with its order is produced. Thus the fringe order can be extracted easily from the fringe intensity or color, and then the absolute phase and the absolute depth range can be obtained also. This technique needs only a single image or double images
Keywords
diffraction gratings; distance measurement; image colour analysis; image texture; moire fringes; object recognition; optical modulation; 3D image measurement methods; 3D objects; absolute depth range measurement; absolute fringe order; correspondence relation; fringe intensity; fringe order; interfering pattern; modulation Moire topography; modulation projection; phase analysis method; phase unwrapping; reflective pattern; spatial pattern projection technique; Color; Data mining; Interference; Pattern analysis; Phase measurement; Robustness; Skeleton; Surfaces; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location
Barcelona
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.905496
Filename
905496
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