• DocumentCode
    1742816
  • Title

    An absolute depth range measurement of 3-D objects based on modulation Moire topography

  • Author

    Lu, Cunwei ; Inokuchi, Seiji

  • Author_Institution
    Fukuoka Inst. of Technol., Japan
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    754
  • Abstract
    It is the foundation that the absolute fringe order is discerned in 3-D image measurement methods, such as spatial pattern projection technique and Moire topography. The reason is that the depth range of the object is computed from the correspondence relation between the fringe order of a reflective pattern and the depth of an object. Multiple images are need by the conventional method for discerning the fringes order. Moreover, it has a problem of phase unwrapping in the phase analysis method of a Moire pattern or other interfering pattern. So it is difficult to calculate the absolute phase or to discern the relation between the fringes, especially in cases of which the fringes are discontinuous or the objects are isolated, and so forth. The technique of using modulation projection with 3-D information is presented. A new fringes pattern whose fringe intensity or color changes with its order is produced. Thus the fringe order can be extracted easily from the fringe intensity or color, and then the absolute phase and the absolute depth range can be obtained also. This technique needs only a single image or double images
  • Keywords
    diffraction gratings; distance measurement; image colour analysis; image texture; moire fringes; object recognition; optical modulation; 3D image measurement methods; 3D objects; absolute depth range measurement; absolute fringe order; correspondence relation; fringe intensity; fringe order; interfering pattern; modulation Moire topography; modulation projection; phase analysis method; phase unwrapping; reflective pattern; spatial pattern projection technique; Color; Data mining; Interference; Pattern analysis; Phase measurement; Robustness; Skeleton; Surfaces; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2000. Proceedings. 15th International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-0750-6
  • Type

    conf

  • DOI
    10.1109/ICPR.2000.905496
  • Filename
    905496