DocumentCode
1742911
Title
A histogram-based classifier on overlapped bins
Author
Kudo, Mineichi ; Imai, Hideyuki ; Shimbo, Masaru
Author_Institution
Div. of Syst. & Inf. Eng., Hokkaido Univ., Sapporo, Japan
Volume
2
fYear
2000
fDate
2000
Firstpage
29
Abstract
The subclass method is a classifier based on approximation of class regions. It assumes that all classes are separable (but not necessarily linear separable). We extend the method so as to meet cases in which class-conditional probability density functions (PDFs) overlap each other. In this extension, the method becomes a histogram approach for approximating PDFs, but the method allows overlapping of bins unlike usual histogram approaches. It is shown that this method is consistent in the sense that the error rate approaches the Bayes error rate as the number of samples tends to infinity. It is also shown that the convergence rate is faster than that using a previous MDL-based histogram approach in the range of practical number of samples
Keywords
Bayes methods; approximation theory; convergence; error statistics; learning (artificial intelligence); pattern classification; probability; statistical analysis; Bayes method; approximation; error rate; histogram; overlapped bins; pattern classification; probability density function; training samples; Convergence; Density functional theory; Error analysis; Frequency estimation; H infinity control; Histograms; Pattern recognition; Probability density function; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location
Barcelona
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.906012
Filename
906012
Link To Document