DocumentCode :
1742911
Title :
A histogram-based classifier on overlapped bins
Author :
Kudo, Mineichi ; Imai, Hideyuki ; Shimbo, Masaru
Author_Institution :
Div. of Syst. & Inf. Eng., Hokkaido Univ., Sapporo, Japan
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
29
Abstract :
The subclass method is a classifier based on approximation of class regions. It assumes that all classes are separable (but not necessarily linear separable). We extend the method so as to meet cases in which class-conditional probability density functions (PDFs) overlap each other. In this extension, the method becomes a histogram approach for approximating PDFs, but the method allows overlapping of bins unlike usual histogram approaches. It is shown that this method is consistent in the sense that the error rate approaches the Bayes error rate as the number of samples tends to infinity. It is also shown that the convergence rate is faster than that using a previous MDL-based histogram approach in the range of practical number of samples
Keywords :
Bayes methods; approximation theory; convergence; error statistics; learning (artificial intelligence); pattern classification; probability; statistical analysis; Bayes method; approximation; error rate; histogram; overlapped bins; pattern classification; probability density function; training samples; Convergence; Density functional theory; Error analysis; Frequency estimation; H infinity control; Histograms; Pattern recognition; Probability density function; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.906012
Filename :
906012
Link To Document :
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