DocumentCode :
1742931
Title :
Another look at combining rejection-based pattern classifiers
Author :
Mascarilla, Laurent ; Frélicot, Carl
Author_Institution :
Lab. d´´Inf. et d´´Imagerie Ind., Univ. de La Rochelle, France
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
156
Abstract :
In the context of pattern classification with two-fold reject options (ambiguity and distance), we have identified different strategies leading to two-stage classifiers. Strategies differ on managing both types of rejection (independently or not). The paper addresses the problem of combining the first stage of rejection-based classifiers of each strategy. A Dempster-Shafer model is designed. Its main characteristic lies in basic probabilities assignments to reject classes before using the combination rule. After combination, a decision rule is proposed for classifying or rejecting patterns. We emphasize that such rejection is not related to a lack of consensus between the classifiers but to the initial reject options. In the case of ambiguity rejection, a class-selective approach has been used. As illustration, results obtained on artificial data are given
Keywords :
pattern classification; probability; uncertainty handling; Dempster-Shafer model; ambiguity rejection; class-selective approach; combination rule; decision rule; probabilities assignments; rejection-based pattern classifiers; two-fold reject options; Decision making; Labeling; Large Hadron Collider; Mathematical model; Pattern classification; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.906038
Filename :
906038
Link To Document :
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