• DocumentCode
    1743015
  • Title

    Learning sparse multiple cause models

  • Author

    Naphade, Milind ; Frey, Brendan ; Chen, Larewnce ; Huang, Thomas

  • Author_Institution
    Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    642
  • Abstract
    Multiple cause models (MCM) are a way to describe patterns as a superposition of a selection of cause patterns. In contrast to clustering methods and dimensionality reduction, multiple cause models are capable of turning local features on and off and this makes them a more realistic model for many types of data. However, inference and learning in general multiple cause models takes an amount of time that is exponential in the number of causes. We present an approximate inference algorithm that examines only sparse cause patterns, i.e., those configurations of causes where only a small number of causes are active at a time. This leads to an approximate EM algorithm that maximizes a lower bound on the likelihood of a data set. We show that this sparse multiple cause model can model different types of human facial expression patterns. Performance comparison of the MCM classifier with the SNoW (sparse network of winnows) architecture and the nearest neighbor classifier reveals significant improvement in classification accuracy using the MCM classifier
  • Keywords
    belief networks; face recognition; feature extraction; image classification; inference mechanisms; learning (artificial intelligence); maximum likelihood estimation; probability; SNoW architecture; approximate EM algorithm; approximate inference algorithm; cause patterns; classification accuracy; human facial expression patterns; local features; nearest neighbor classifier; sparse multiple cause models; sparse network of winnows architecture; Clustering methods; Computer science; Fellows; Humans; Inference algorithms; Nearest neighbor searches; Predictive models; Testing; Turning; Vocabulary;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2000. Proceedings. 15th International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-0750-6
  • Type

    conf

  • DOI
    10.1109/ICPR.2000.906157
  • Filename
    906157