DocumentCode
1743015
Title
Learning sparse multiple cause models
Author
Naphade, Milind ; Frey, Brendan ; Chen, Larewnce ; Huang, Thomas
Author_Institution
Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
642
Abstract
Multiple cause models (MCM) are a way to describe patterns as a superposition of a selection of cause patterns. In contrast to clustering methods and dimensionality reduction, multiple cause models are capable of turning local features on and off and this makes them a more realistic model for many types of data. However, inference and learning in general multiple cause models takes an amount of time that is exponential in the number of causes. We present an approximate inference algorithm that examines only sparse cause patterns, i.e., those configurations of causes where only a small number of causes are active at a time. This leads to an approximate EM algorithm that maximizes a lower bound on the likelihood of a data set. We show that this sparse multiple cause model can model different types of human facial expression patterns. Performance comparison of the MCM classifier with the SNoW (sparse network of winnows) architecture and the nearest neighbor classifier reveals significant improvement in classification accuracy using the MCM classifier
Keywords
belief networks; face recognition; feature extraction; image classification; inference mechanisms; learning (artificial intelligence); maximum likelihood estimation; probability; SNoW architecture; approximate EM algorithm; approximate inference algorithm; cause patterns; classification accuracy; human facial expression patterns; local features; nearest neighbor classifier; sparse multiple cause models; sparse network of winnows architecture; Clustering methods; Computer science; Fellows; Humans; Inference algorithms; Nearest neighbor searches; Predictive models; Testing; Turning; Vocabulary;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location
Barcelona
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.906157
Filename
906157
Link To Document