DocumentCode :
1743047
Title :
Classification of style-constrained pattern-fields
Author :
Sarkar, Rrateek ; Nagy, George
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
855
Abstract :
In some classification tasks, all patterns in a field, such as digits in a ZIP-code image, originate from the same, but unknown, source (writer/print style). The class-conditional feature distributions depend on the source of the patterns. Several sources may share the same distribution, or style. The style-conditional distributions are estimated from the training set. The optimal field-classifier computes the class-conditional field-feature-probabilities as the sum of class-and-style-conditional field-feature-probabilities, weighted by the prior probabilities of the styles. We compare the decision regions and error rates of style-weighted classification with both conventional singlet and top-style classification in a minimal family of examples, and discuss some related practical considerations
Keywords :
image classification; optical character recognition; ZIP-code image; class-and-style-conditional field-feature-probabilities; class-conditional feature distributions; class-conditional field-feature-probabilities; digits; optimal field-classifier; singlet classification; style-constrained pattern-field classification; top-style classification; Context modeling; Economic indicators; Electronic mail; Error analysis; Gaussian distribution; Parameter estimation; Pattern recognition; Soil measurements; Speech; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.906209
Filename :
906209
Link To Document :
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