DocumentCode :
1743092
Title :
Use of microwave technology for rapid cure of chip-on-board glob top encapsulants
Author :
Wei, J. Billy ; Fathi, Zak ; Pan, Binghua ; Nah, Chih Kai ; Chan, Su Liang
Author_Institution :
Lambda Technol. Inc., Morrisville, NC, USA
fYear :
2000
fDate :
2000
Firstpage :
181
Lastpage :
185
Abstract :
Chip-on-board (COB) is widely used in manufacturing electronic packages for automotive, computers and other electronic components. Glob top encapsulation is used to protect semiconductor chips and bonded wires from adverse environments to increase long-term reliability of COB assemblies. However, current manufacturing practice normally involves a 2-4 hour long curing step to cure glob top encapsulants. Variable frequency microwave (VFM) technology was specifically developed to apply microwave energy to the rapid cure of various advanced materials, while not interfering with metallic components or electronic circuitry. VFM curing of COB glob top encapsulants has been performed with a wide range of encapsulants from various vendors. Key materials properties were measured after VFM curing and were compared to those of thermally cured samples. In general, VFM dramatically shortened the cycle time and provided the same cure quality as conventional thermal cure. This study reports that VFM curing of COB encapsulants is a rapid, selective and reliable process. Main results are: (1) the nominal VFM curing cycle is 15 minutes or less as compared to a 2 hour nominal thermal cure cycle; (2) no specific modification of encapsulant chemistry is necessary for VFM curing; (3) glob top encapsulants cured by VFM yielded equivalent extent of cure, Tg and CTE properties as compared to those of convection oven cured samples; (4) VFM has no adverse impact on functionality of the electronic components. VFM processing has therefore been demonstrated as an attractive alternative to conventional thermal processing
Keywords :
chip-on-board packaging; encapsulation; glass transition; heat treatment; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; microwave heating; thermal expansion; COB; COB assemblies; COB encapsulants; COB glob top encapsulants; CTE properties; VFM curing; VFM curing cycle; VFM processing; adverse environments; bonded wire protection; chip-on-board; chip-on-board glob top encapsulants; convection oven cured samples; cure extent; cure quality; curing step; cycle time; electronic circuitry; electronic components; electronic packages; encapsulant chemistry; encapsulants; functionality; glass transition; glob top encapsulant cure; glob top encapsulation; long-term reliability; materials properties; metallic components; microwave energy; microwave technology; rapid cure; reliable process; selective process; semiconductor chip protection; thermal cure; thermal processing; thermally cured samples; variable frequency microwave technology; Components, packaging, and manufacturing technology; Computer aided manufacturing; Curing; Electronic components; Electronics packaging; Microwave ovens; Microwave technology; Rapid thermal processing; Semiconductor device manufacture; Semiconductor device packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
Type :
conf
DOI :
10.1109/EPTC.2000.906370
Filename :
906370
Link To Document :
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