DocumentCode :
1743095
Title :
Does underfilling enhance BGA reliability?
Author :
Pyland, James ; Pucha, Raghuram ; Sitaram, Sunayana
Author_Institution :
CASPaR Lab., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2000
fDate :
2000
Firstpage :
241
Lastpage :
245
Abstract :
The effect of underfill on various thermomechanical reliability issues in SBGA (super ball grid array) packages is studied in this paper. Nonlinear finite element models with underfill and no-underfill have been developed, taking into consideration the process-induced residual stresses. In this study, the solder is modeled as time and temperature-dependent, while other materials are modeled as temperature and direction-dependent, as appropriate. The stress/strain variations in solder joints due to thermal cycling are analyzed. The effect of underfill is studied with respect to magnitude and location of time-independent plastic strain, time-dependent creep strain and total inelastic strain in solder balls. The possibility of delamination at the interposer-underfill interface and at the board-underfill interface is studied with the help of qualitative interfacial stress analysis. Results on SBGA packages indicate that the underfill does not always enhance BGA reliability, and that the properties of the underfill have a significant role in the overall reliability of the BGA solder balls
Keywords :
ball grid arrays; creep; delamination; encapsulation; finite element analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit reliability; interface structure; internal stresses; plastic deformation; soldering; stress analysis; BGA reliability; BGA solder balls; SBGA packages; board-underfill interface; delamination; interposer-underfill interface; nonlinear finite element models; overall reliability; package materials temperature/direction-dependent model; process-induced residual stresses; qualitative interfacial stress analysis; solder balls; solder joints; solder time/temperature-dependent model; stress/strain variations; super ball grid array packages; thermal cycling; thermomechanical reliability; time-dependent creep strain; time-independent plastic strain; total inelastic strain; underfill; underfill properties; underfilling; Capacitive sensors; Creep; Electronics packaging; Finite element methods; Plastics; Residual stresses; Soldering; Temperature; Thermal stresses; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
Type :
conf
DOI :
10.1109/EPTC.2000.906380
Filename :
906380
Link To Document :
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