• DocumentCode
    1743160
  • Title

    Characterization of lead-free solder by reliability testing

  • Author

    Tzan, S.-R. ; Chu, S.-L.

  • Author_Institution
    Mater. Res. Labs., ITRI, Taiwan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    270
  • Lastpage
    273
  • Abstract
    Green materials have become a hot topic recently due to environmental issues. Lead contamination problems from end products in landfills have gathered industrial attention over the past decade. Several research programs on lead free solder have been performed, but no drop-in alternative was found to replace traditional tin-lead solder alloy. Tin-silver base solder alloys, such as Sn-Ag and Sn-Ag-Cu, are some of the more promising materials for tin-lead solder alloy replacement. However, most of the alternatives lack long-term data for reliability and/or mechanical testing results. In this paper, a chip scale package (CSP) is used to investigate the characteristics of the tin-silver solder alloy. Two surface finishes are implemented on the printed circuit boards (PCBs) to compare the solderability of the alternative materials. Several testing methods are performed to examine the properties and failure modes of tin-silver solder and tin-lead solder alloys
  • Keywords
    adhesion; assembling; chip scale packaging; circuit reliability; dynamic testing; failure analysis; integrated circuit interconnections; printed circuit manufacture; printed circuit testing; silver alloys; soldering; surface treatment; tin alloys; CSP; PCBs; Sn-Ag solder alloy; Sn-Ag-Cu solder alloy; SnAg; SnAgCu; SnPb; chip scale package; environmental issues; failure modes; green materials; landfills; lead contamination; lead free solder; lead-free solder; mechanical testing; printed circuit boards; reliability; reliability testing; solderability; surface finishes; testing methods; tin-lead solder; tin-lead solder alloy; tin-lead solder alloy replacement; tin-silver base solder alloys; tin-silver solder; tin-silver solder alloy; Automation; Biological materials; Chip scale packaging; Electronic equipment testing; Environmentally friendly manufacturing techniques; Lead; Manufacturing industries; Materials science and technology; Sliding mode control; Surface finishing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-6482-1
  • Type

    conf

  • DOI
    10.1109/IEMT.2000.910737
  • Filename
    910737