Title :
Conductivity assessment of conductive polymer bonding for flip chip applications
Author :
Sun, Ming ; Loo, Mike ; Dandia, Sanjay
Author_Institution :
Philips Semicond., San Jose, CA, USA
Abstract :
Numerous experimental studies of electrically conductive polymers have shown that bonding systems between flip chip and substrate with conductive polymers have a certain amount of contact resistance between contact pad and conductive polymer and among the fillers, in addition to the bulk resistance of the fillers themselves. The contact resistance of a conductive polymer bonding system and its variation in a life cycle are obviously two important parameters that impact the electrical behavior of electrical components and devices, if flip chip bonding is involved in their packaging. There are two kinds of conductive polymers, isotropically conductive polymer and anisotropically conductive polymer, which have been intensively studied for application to flip chip packaging. Conductive polymers generally consist of conductive filler and adhesive polymer matrix. The electrical conductivity depends not only on filler material, filler ratio, and operating environment, but also on filler packing structure, voltage drop across the contact spot and mechanical stress due to the mismatch of coefficients of thermal expansion, which results in deformation of the chip and substrate. In this paper, we conducted an analysis, based on fundamental electrical contact physics, material kinetics and particle packing structure, to deepen our understanding of the correlation between the conductivity of the polymer bonding system and key variables such as filler packing configuration, stress, voltage drop and operating environment
Keywords :
conducting polymers; contact resistance; deformation; electrical conductivity; environmental degradation; filled polymers; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; internal stresses; thermal expansion; adhesive polymer matrix; anisotropically conductive polymer; bonding systems; bulk resistance; chip deformation; coefficient of thermal expansion mismatch; conductive filler; conductive polymer bonding; conductive polymer bonding system; conductive polymers; conductivity; contact pad; contact resistance; contact spot voltage drop; electrical components; electrical conductivity; electrical contact physics; electrically conductive polymers; filler material; filler packing configuration; filler packing structure; filler ratio; fillers; flip chip; flip chip applications; flip chip bonding; flip chip packaging; isotropically conductive polymer; life cycle contact resistance variation; material kinetics; mechanical stress; operating environment; packaging; particle packing structure; polymer bonding system; stress; voltage drop; Bonding; Conducting materials; Contact resistance; Electric resistance; Flip chip; Packaging; Polymers; Stress; Thermal conductivity; Voltage;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-6482-1
DOI :
10.1109/IEMT.2000.910739