DocumentCode
1743919
Title
On improved graph-based alternative wiring scheme for multi-level logic optimization
Author
Wu, Yu-Liang ; Sze, Chin-Ngai ; Cheung, Chak-Chung ; Fan, Hongbing
Author_Institution
Chinese Univ. of Hong Kong, Shatin, China
Volume
2
fYear
2000
fDate
2000
Firstpage
654
Abstract
A much extended graph-based alternative wiring (GBAW) scheme to identify alternative wires in multilevel logic with promising results is presented. By modeling subsets of circuits as minimal graphs and applying purely graph-based local pattern search technique, we have found more than 40 graph patterns which contain alternative wires within 2-edge distance from the target wire. Applying proper grouping technique for the similar patterns, the complexity of our rewiring technique can be reduced. Experimental results on MCNC benchmarks show that our technique is much faster than the ATPG-based technique RAMBO with competitive number of alternative wires found. With this augmented pattern family of alternative wires, we are able to find 30% more alternative wires compared to RAMBO with 75 times speedup on average. We applied GBAW in logic minimization as a perturbation engine and simplify the target circuit by SIS algebraic operations. Results show a further reduction of 11.1% in literal count compared to applying algebraic operations alone
Keywords
circuit layout CAD; circuit optimisation; integrated circuit layout; logic CAD; minimisation of switching nets; multivalued logic circuits; wiring; MCNC benchmarks; SIS algebraic operations; augmented pattern family; graph-based alternative wiring scheme; graph-based local pattern search technique; grouping technique; logic minimization; minimal graphs; multi-level logic optimization; perturbation engine; Automatic test pattern generation; Circuit optimization; Circuit testing; Computer science; Engines; Logic circuits; Logic functions; Minimization; Wires; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2000. ICECS 2000. The 7th IEEE International Conference on
Conference_Location
Jounieh
Print_ISBN
0-7803-6542-9
Type
conf
DOI
10.1109/ICECS.2000.912962
Filename
912962
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