DocumentCode
1744047
Title
Split post dielectric resonator technique for dielectric cure monitoring of structural adhesives
Author
Givot, Bradley L. ; Krupka, Jerzy ; Belete, Dawit Y.
Author_Institution
3M Corp. Res. Lab., 3M Center, St Paul, MN, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
309
Abstract
The split post dielectric resonator (SPDR) technique has been used to monitor in situ changes in the dielectric constant and loss tangent in thermoset adhesives, as a result of the reduction of reactants of relatively low molecular weight. These dielectric studies appear to complement other polymer characterization techniques such as dynamic mechanical analysis (DMA) and differential scanning calorimetric (DSC) methods. Although other types of dielectric cure monitoring devices are available, we feel that the split post dielectric resonator offers maximum sensitivity for determining the dielectric parameters directly and accurately
Keywords
adhesives; dielectric loss measurement; dielectric resonators; permittivity measurement; polymers; dielectric constant; dielectric cure monitoring; dielectric loss tangent; polymer characterization techniques; split post dielectric resonator technique; structural adhesives; thermoset adhesives; Curing; Dielectric constant; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Loss measurement; Monitoring; Permittivity measurement; Polymers;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on
Conference_Location
Wroclaw
Print_ISBN
83-906662-3-5
Type
conf
DOI
10.1109/MIKON.2000.913931
Filename
913931
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