• DocumentCode
    1744047
  • Title

    Split post dielectric resonator technique for dielectric cure monitoring of structural adhesives

  • Author

    Givot, Bradley L. ; Krupka, Jerzy ; Belete, Dawit Y.

  • Author_Institution
    3M Corp. Res. Lab., 3M Center, St Paul, MN, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    309
  • Abstract
    The split post dielectric resonator (SPDR) technique has been used to monitor in situ changes in the dielectric constant and loss tangent in thermoset adhesives, as a result of the reduction of reactants of relatively low molecular weight. These dielectric studies appear to complement other polymer characterization techniques such as dynamic mechanical analysis (DMA) and differential scanning calorimetric (DSC) methods. Although other types of dielectric cure monitoring devices are available, we feel that the split post dielectric resonator offers maximum sensitivity for determining the dielectric parameters directly and accurately
  • Keywords
    adhesives; dielectric loss measurement; dielectric resonators; permittivity measurement; polymers; dielectric constant; dielectric cure monitoring; dielectric loss tangent; polymer characterization techniques; split post dielectric resonator technique; structural adhesives; thermoset adhesives; Curing; Dielectric constant; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Loss measurement; Monitoring; Permittivity measurement; Polymers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on
  • Conference_Location
    Wroclaw
  • Print_ISBN
    83-906662-3-5
  • Type

    conf

  • DOI
    10.1109/MIKON.2000.913931
  • Filename
    913931