DocumentCode :
1744051
Title :
Characterization of low loss dielectric materials in millimeter wave region using a whispering gallery mode resonator
Author :
Kogami, Yoshinori ; Tamura, Hajime ; Matsumura, Kazuhito
Author_Institution :
Fac. of Eng., Utsunomiya Univ., Japan
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
340
Abstract :
A new method for measuring the complex permittivity of a low loss material in the millimeter wave region is developed. The heart of the method is a higher order whispering gallery mode resonator which is made of the material under test. The method has a great advantage for millimeter measurements because the dielectric disk resonator does not need a shielding metal structure. Measured results of some plastic and ceramic materials in the 50 to 110 GHz band are presented
Keywords :
dielectric materials; dielectric resonators; millimetre wave measurement; permittivity measurement; 50 to 110 GHz; ceramic materials; complex permittivity measurement; dielectric disk resonator; low loss dielectric material characterization; millimeter wave region; plastic materials; whispering gallery mode resonator; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Heart; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Whispering gallery modes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
83-906662-3-5
Type :
conf
DOI :
10.1109/MIKON.2000.913939
Filename :
913939
Link To Document :
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